ASNT

ACKNOWLEDGMENTS This Radiographic Testing Volume 3 of the fourth edition of the ASNT Nondestructive Testing Handbook is indebted to preceding editions. Additionally, and very importantly much of the text has been revised, reedited, and updated by many new authors and reviewers so that the book ref lects both current techniques, equipment, and technology as well as historical examples and fundamentals. The Technical Editors are indebted to the handbook contributors, authors and reviewers, who volunteered to help assemble this book. The ASNT Penetrating Radiation Committee also played a key role in the setting the direction for updates and additions that have been incorporated. A special thanks to Karen Balkin, ASNT Handbook Editor, for her diligent efforts to gather, assemble, and edit the information into an attractive and functional format. We also acknowledge the service of Patrick O. Moore (1951-2017) to ASNT for his decades- long contribution as editor of the Nondestructive Testing Handbook series, creating volumes that provide clear, accurate text and illustrative figures that are the hallmark of a quality reference.

Richard H. Bossi Trey Gordon Technical Editors

WORKING GROUP Contributors Vijay Alreja, VJ Technologies Inc. Luke K. Banks, Digicon Harold Berger, Rockville, Maryland Hassina Bilheux, Oak Ridge National Laboratory Richard Bossi, Renton, Washington Karen L. Bruer, Amee Bay LLC Clifford Bueno, GE Global Research Center Chen Dai, VJ Technologies Inc. John P. Ellegood, Radiographic Solutions LLC Gary E. Georgeson, Lawrence Livermore National Laboratory Trey Gordon, Renton, Washington Kenneth Herwig, Oak Ridge National Laboratory Boeing Company Steven M. Glenn,

Enrico Quintana, Sandia National Laboratories Mansoureh Norouzi Rad, Carl Zeiss Microscopy LLC Edward H. Ruescher, Coueur d’Alene, Idaho Morteza Safai, Boeing Company Lou Santodonato, Oak Ridge National Laboratory Daniel J. Schneberk, Lawrence Livermore National Laboratory Mark Shilton, QSA Global Inc. Bryan Shumway, Jr., Prime NDT Services George R. Strabel, Norton Shores, Michigan Michael J. Taylor, Phoenix LLC Kyle R. Thompson, Sandia National Laboratories Marvin Trimm, Savannah River Laboratory Jeffery A. Umbach, Palm Beach Gardens, Florida Karen Ursel, Carestream Health Inc.

Thomas S. Jones, Winchester, Virginia Burke L. Kernen, Sandia National Laboratories Timothy Kinsella, Dassault Falcon Jet Corp. Stuart A. Kleven, Alloyweld Inspection Company Inc. Mark Lessard, Thermo Fisher Scientific Xin Li, GE Global Research Center Richard D. Lopez, John Deere Moline Technology Innovation Center Thomas Maeder, Boeing Company Steven A. Mango, Morganton, Georgia Harry E. Martz Jr., Lawrence Livermore National Laboratory

Jim Neal, Fuji Film W.L. Nighan,

ETM-Electromatic Inc. J. Scott Price, GE Global Research Center

PREFACE

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